White Light Interferometry: Redefining Surface Metrology for Precision Manufacturing
White light interferometry has surged to the forefront of surface metrology as manufacturers seek rapid, non-contact, high-resolution insight into complex topographies. By exploiting the broad spectrum of white light, WLI records interference patterns that translate into precise 3D maps of height, texture, and waviness. Unlike single-point profilers, it offers large fields of view and fast acquisition, delivering reliable data across plastics, metals, coatings, and multilayer assemblies. This combination of non-contact measurement and sub-micron vertical resolution makes WLI a versatile workhorse for root-cause analysis and design verification in development labs and in-line QC. Across industries, WLI enables tangible gains: faster defect detection on optics and semiconductor surfaces; accurate form and roughness characterization for medical devices; and flatness checks on automotive components. The technology produces comprehensive 3D topography and numerical surface parameters, ...